M. Nagatani
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1986
1
EE
Norio Kuji
,
Teruo Tamama
, M. Nagatani: FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 5
(2): 313-319 (1986)
Coauthor
Index
1
Norio Kuji
[
1
]
2
Teruo Tamama
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)