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M. Nagatani

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1986
1EENorio Kuji, Teruo Tamama, M. Nagatani: FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(2): 313-319 (1986)

Coauthor Index

1Norio Kuji [1]
2Teruo Tamama [1]

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