| |
| 1999 | ||
|---|---|---|
| 5 | EE | Von-Kyoung Kim, Tom Chen, Mick Tegethoff: Fault Coverage Estimation for Early Stage of VLSI Design. Great Lakes Symposium on VLSI 1999: 105-108 |
| 4 | EE | Von-Kyoung Kim, Tom Chen: Assessing Defect Coverage of Memory Testing Algorithms. Great Lakes Symposium on VLSI 1999: 340- |
| 3 | EE | Von-Kyoung Kim, Tom Chen: On comparing functional fault coverage and defect coverage for memory testing. IEEE Trans. on CAD of Integrated Circuits and Systems 18(11): 1676-1683 (1999) |
| 1997 | ||
| 2 | Von-Kyoung Kim, Tom Chen, Mick Tegethoff: ASIC Manufacturing Test Cost Prediction at Early Design Stage. ITC 1997: 356-361 | |
| 1996 | ||
| 1 | Von-Kyoung Kim, Mick Tegethoff, Tom Chen: ASIC Yield Estimation at Early Design Cycle. ITC 1996: 590-594 | |
| 1 | Tom Chen | [1] [2] [3] [4] [5] |
| 2 | Mick Tegethoff | [1] [2] [5] |