2002 |
4 | EE | Tom Austin,
Charisma Canlas,
Brady Morgan,
Jorge Luis Rodriguez:
Across the Great Divide: Examination of Simulation Data with Actual Silicon Waveforms Improves Device Characterization and Production Test Development.
ITC 2002: 270-279 |
1998 |
3 | EE | Craig Force,
Tom Austin:
Testing the design: the evolution of test simulation.
ITC 1998: 612- |
1995 |
2 | | Jean Qincui Xia,
Tom Austin,
Nash Khouzam:
Dynamic Test Emulation for EDA-Based Mixed-Signal Test Development Automation.
ITC 1995: 761-770 |
1993 |
1 | | Tom Austin:
Creating A Mixed-Signal Simulation Capability for Concurrent IC Design and Test Program Development.
ITC 1993: 125-132 |