| |
| 2004 | ||
|---|---|---|
| 3 | EE | Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba: Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. ACM Great Lakes Symposium on VLSI 2004: 322-327 |
| 2001 | ||
| 2 | Mohammad Athar Khalil, Chin-Long Wey: Extreme-voltage stress vector generation of analog CMOS ICs for gate-oxide reliability enhancement. ITC 2001: 348-357 | |
| 1 | EE | Mohammad Athar Khalil, Chin-Long Wey: High-Voltage Stress Test Paradigms of Analog CMOS ICs for Gate-Oxide Reliability Enhancement. VTS 2001: 333-338 |
| 1 | Jim Liu | [3] |
| 2 | Chin-Long Wey | [1] [2] [3] |
| 3 | Gregory Wierzba | [3] |