| |
| 2004 | ||
|---|---|---|
| 1 | EE | Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba: Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. ACM Great Lakes Symposium on VLSI 2004: 322-327 |
| 1 | Mohammad Athar Khalil | [1] |
| 2 | Jim Liu | [1] |
| 3 | Chin-Long Wey | [1] |