dblp.uni-trier.dewww.uni-trier.de

V. Mosser

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2005
1EEA. Kerlain, V. Mosser: Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices. Microelectronics Reliability 45(9-11): 1327-1330 (2005)

Coauthor Index

1A. Kerlain [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)