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| 2005 | ||
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| 1 | EE | A. Kerlain, V. Mosser: Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices. Microelectronics Reliability 45(9-11): 1327-1330 (2005) |
| 1 | A. Kerlain | [1] |