| |
| 2002 | ||
|---|---|---|
| 3 | EE | B. K. Jones: Logarithmic distributions in reliability analysis. Microelectronics Reliability 42(4-5): 779-786 (2002) |
| 2001 | ||
| 2 | EE | B. K. Jones, C. N. Graham, A. Konczakowska, L. Hasse: The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. Microelectronics Reliability 41(1): 87-97 (2001) |
| 1988 | ||
| 1 | A. P. Dorey, B. K. Jones, Andrew M. D. Richardson, P. C. Russell, Y. Z. Xu: Reliability Testing by Precise Electrical Measurement. ITC 1988: 369-373 | |
| 1 | A. P. Dorey | [1] |
| 2 | C. N. Graham | [2] |
| 3 | L. Hasse | [2] |
| 4 | A. Konczakowska | [2] |
| 5 | Andrew M. D. Richardson | [1] |
| 6 | P. C. Russell | [1] |
| 7 | Y. Z. Xu | [1] |