C. N. Graham

2001
1	EE	B. K. Jones, C. N. Graham, A. Konczakowska, L. Hasse: The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. Microelectronics Reliability 41(1): 87-97 (2001)

Coauthor Index

1	L. Hasse	[1]
2	B. K. Jones	[1]
3	A. Konczakowska	[1]