A. Konczakowska
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2001
1
EE
B. K. Jones
,
C. N. Graham
, A. Konczakowska,
L. Hasse
: The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs.
Microelectronics Reliability 41
(1): 87-97 (2001)
Coauthor
Index
1
C. N. Graham
[
1
]
2
L. Hasse
[
1
]
3
B. K. Jones
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
