| |
| 2007 | ||
|---|---|---|
| 4 | EE | Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design. DAC 2007: 533-538 |
| 3 | EE | Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Supply Voltage Noise Aware ATPG for Transition Delay Faults. VTS 2007: 179-186 |
| 2006 | ||
| 2 | EE | Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: Timing-based delay test for screening small delay defects. DAC 2006: 320-325 |
| 1 | EE | Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram: A novel framework for faster-than-at-speed delay test considering IR-drop effects. ICCAD 2006: 198-203 |
| 1 | Nisar Ahmed | [1] [2] [3] [4] |
| 2 | Mohammad Tehranipoor | [1] [2] [3] [4] |