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2002 | ||
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2 | EE | Yuichi Hamamura, Kazunori Nemoto, Takaaki Kumazawa, Hisafumi Iwata, Kousuke Okuyama, Shiro Kamohara, Aritoshi Sugimoto: Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure. DFT 2002: 305-313 |
1998 | ||
1 | EE | Atsushi Shimoda, Hisafumi Iwata, Yukihiro Shibata, Hidehiro Ikeda: Thin Film Magnetic Head Wafer Inspection Technique Using Geometrical Feature Based Image Comparison. MVA 1998: 531-534 |
1 | Yuichi Hamamura | [2] |
2 | Hidehiro Ikeda | [1] |
3 | Shiro Kamohara | [2] |
4 | Takaaki Kumazawa | [2] |
5 | Kazunori Nemoto | [2] |
6 | Kousuke Okuyama | [2] |
7 | Yukihiro Shibata | [1] |
8 | Atsushi Shimoda | [1] |
9 | Aritoshi Sugimoto | [2] |