Hisafumi Iwata

2002
2	EE	Yuichi Hamamura, Kazunori Nemoto, Takaaki Kumazawa, Hisafumi Iwata, Kousuke Okuyama, Shiro Kamohara, Aritoshi Sugimoto: Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure. DFT 2002: 305-313
1998
1	EE	Atsushi Shimoda, Hisafumi Iwata, Yukihiro Shibata, Hidehiro Ikeda: Thin Film Magnetic Head Wafer Inspection Technique Using Geometrical Feature Based Image Comparison. MVA 1998: 531-534

Coauthor Index

1	Yuichi Hamamura	[2]
2	Hidehiro Ikeda	[1]
3	Shiro Kamohara	[2]
4	Takaaki Kumazawa	[2]
5	Kazunori Nemoto	[2]
6	Kousuke Okuyama	[2]
7	Yukihiro Shibata	[1]
8	Atsushi Shimoda	[1]
9	Aritoshi Sugimoto	[2]

Colors in the list of coauthors