| |
| 2002 | ||
|---|---|---|
| 1 | EE | Yuichi Hamamura, Kazunori Nemoto, Takaaki Kumazawa, Hisafumi Iwata, Kousuke Okuyama, Shiro Kamohara, Aritoshi Sugimoto: Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure. DFT 2002: 305-313 |
| 1 | Yuichi Hamamura | [1] |
| 2 | Hisafumi Iwata | [1] |
| 3 | Shiro Kamohara | [1] |
| 4 | Takaaki Kumazawa | [1] |
| 5 | Kousuke Okuyama | [1] |
| 6 | Aritoshi Sugimoto | [1] |