| |
| 1998 | ||
|---|---|---|
| 1 | EE | Atsushi Shimoda, Hisafumi Iwata, Yukihiro Shibata, Hidehiro Ikeda: Thin Film Magnetic Head Wafer Inspection Technique Using Geometrical Feature Based Image Comparison. MVA 1998: 531-534 |
| 1 | Hisafumi Iwata | [1] |
| 2 | Yukihiro Shibata | [1] |
| 3 | Atsushi Shimoda | [1] |