Shiro Kamohara

2002
2	EE	Yuichi Hamamura, Kazunori Nemoto, Takaaki Kumazawa, Hisafumi Iwata, Kousuke Okuyama, Shiro Kamohara, Aritoshi Sugimoto: Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure. DFT 2002: 305-313
2000
1	EE	Mikako Miyama, Shiro Kamohara: Circuit performance oriented device optimization using BSIM3 pre-silicon model parameters. ASP-DAC 2000: 371-374

Coauthor Index

1	Yuichi Hamamura	[2]
2	Hisafumi Iwata	[2]
3	Takaaki Kumazawa	[2]
4	Mikako Miyama	[1]
5	Kazunori Nemoto	[2]
6	Kousuke Okuyama	[2]
7	Aritoshi Sugimoto	[2]

Colors in the list of coauthors