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2002 | ||
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1 | EE | Yuichi Hamamura, Kazunori Nemoto, Takaaki Kumazawa, Hisafumi Iwata, Kousuke Okuyama, Shiro Kamohara, Aritoshi Sugimoto: Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure. DFT 2002: 305-313 |
1 | Yuichi Hamamura | [1] |
2 | Hisafumi Iwata | [1] |
3 | Shiro Kamohara | [1] |
4 | Takaaki Kumazawa | [1] |
5 | Kazunori Nemoto | [1] |
6 | Aritoshi Sugimoto | [1] |