| |
| 2002 | ||
|---|---|---|
| 6 | EE | Asad A. Ismaeel, R. Bhatnagar, Rajan Mathew: On-line testable data path synthesis for minimizing testing time. Microelectronics Reliability 42(3): 437-453 (2002) |
| 2001 | ||
| 5 | EE | Asad A. Ismaeel, Rajan Mathew, R. Bhatnagar: Module allocation with idle-time utilization for on-line testability. Microelectronics Reliability 41(2): 323-332 (2001) |
| 1996 | ||
| 4 | EE | Asad A. Ismaeel, Muhammad K. Dhodhi, Rajan Mathew: Assignment and allocation of highly testable data paths under scan optimization. Integration 21(3): 191-207 (1996) |
| 1995 | ||
| 3 | Pranay Chaudhuri, Asad A. Ismaeel: Algorithms for Finding and Updating Minimum-Depth Spanning Trees in Parallel. Inf. Sci. 87(1-3): 171-183 (1995) | |
| 1991 | ||
| 2 | EE | Asad A. Ismaeel, Melvin A. Breuer: The probability of error detection in sequential circuits using random test vectors. J. Electronic Testing 1(4): 245-256 (1991) |
| 1986 | ||
| 1 | Melvin A. Breuer, Asad A. Ismaeel: Roving Emulation as a Fault Detection Mechanism. IEEE Trans. Computers 35(11): 933-939 (1986) | |
| 1 | R. Bhatnagar | [5] [6] |
| 2 | Melvin A. Breuer | [1] [2] |
| 3 | Pranay Chaudhuri | [3] |
| 4 | Muhammad K. Dhodhi | [4] |
| 5 | Rajan Mathew | [4] [5] [6] |