| |
| 2002 | ||
|---|---|---|
| 3 | EE | Asad A. Ismaeel, R. Bhatnagar, Rajan Mathew: On-line testable data path synthesis for minimizing testing time. Microelectronics Reliability 42(3): 437-453 (2002) |
| 2001 | ||
| 2 | EE | Asad A. Ismaeel, Rajan Mathew, R. Bhatnagar: Module allocation with idle-time utilization for on-line testability. Microelectronics Reliability 41(2): 323-332 (2001) |
| 1996 | ||
| 1 | EE | Asad A. Ismaeel, Muhammad K. Dhodhi, Rajan Mathew: Assignment and allocation of highly testable data paths under scan optimization. Integration 21(3): 191-207 (1996) |
| 1 | R. Bhatnagar | [2] [3] |
| 2 | Muhammad K. Dhodhi | [1] |
| 3 | Asad A. Ismaeel | [1] [2] [3] |