| 2006 |
|---|
| 3 | EE | Markus Bühler,
Jürgen Koehl,
Jeanne Bickford,
Jason Hibbeler,
Ulf Schlichtmann,
R. Sommer,
Michael Pronath,
Andreas Ripp:
DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design.
DATE 2006: 387-392 |
| 2 | EE | Jeanne Bickford,
Jason Hibbeler,
Markus Bühler,
Jürgen Koehl,
Dirk Muller,
Sven Peyer,
Christian Schulte:
Yield Improvement by Local Wiring Redundancy.
ISQED 2006: 473-478 |
| 2005 |
|---|
| 1 | EE | Xin Yuan,
Kevin W. McCullen,
Fook-Luen Heng,
Robert F. Walker,
Jason Hibbeler,
Robert J. Allen,
Rani R. Narayan:
Technology migration technique for designs with strong RET-driven layout restrictions.
ISPD 2005: 175-182 |
