2006 | ||
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2 | EE | Markus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, R. Sommer, Michael Pronath, Andreas Ripp: DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design. DATE 2006: 387-392 |
1 | EE | Jeanne Bickford, Jason Hibbeler, Markus Bühler, Jürgen Koehl, Dirk Muller, Sven Peyer, Christian Schulte: Yield Improvement by Local Wiring Redundancy. ISQED 2006: 473-478 |
1 | Markus Bühler | [1] [2] |
2 | Jason Hibbeler | [1] [2] |
3 | Jürgen Koehl | [1] [2] |
4 | Dirk Muller | [1] |
5 | Sven Peyer | [1] |
6 | Michael Pronath | [2] |
7 | Andreas Ripp | [2] |
8 | Ulf Schlichtmann | [2] |
9 | Christian Schulte | [1] |
10 | R. Sommer | [2] |