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Jeanne Bickford

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2006
2EEMarkus Bühler, Jürgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, R. Sommer, Michael Pronath, Andreas Ripp: DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design. DATE 2006: 387-392
1EEJeanne Bickford, Jason Hibbeler, Markus Bühler, Jürgen Koehl, Dirk Muller, Sven Peyer, Christian Schulte: Yield Improvement by Local Wiring Redundancy. ISQED 2006: 473-478

Coauthor Index

1Markus Bühler [1] [2]
2Jason Hibbeler [1] [2]
3Jürgen Koehl [1] [2]
4Dirk Muller [1]
5Sven Peyer [1]
6Michael Pronath [2]
7Andreas Ripp [2]
8Ulf Schlichtmann [2]
9Christian Schulte [1]
10R. Sommer [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)