| 2005 |
|---|
| 4 | EE | Markus Karner,
Andreas Gehring,
Stefan Holzer,
Hans Kosina:
Efficient Calculation of Quasi-bound States for the Simulation of Direct Tunneling.
LSSC 2005: 572-577 |
| 2003 |
|---|
| 3 | EE | Andreas Gehring,
F. Jiménez-Molinos,
Hans Kosina,
A. Palma,
F. Gámiz,
Siegfried Selberherr:
Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices.
Microelectronics Reliability 43(9-11): 1495-1500 (2003) |
| 2 | EE | T. Ayalew,
Andreas Gehring,
J. M. Park,
Tibor Grasser,
Siegfried Selberherr:
Improving SiC lateral DMOSFET reliability under high field stress.
Microelectronics Reliability 43(9-11): 1889-1894 (2003) |
| 2002 |
|---|
| 1 | | Andreas Gehring:
Testing of IP Services & Applications in a Service Provider Environment.
TestCom 2002: 17- |
