| |
| 2003 | ||
|---|---|---|
| 1 | EE | Andreas Gehring, F. Jiménez-Molinos, Hans Kosina, A. Palma, F. Gámiz, Siegfried Selberherr: Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices. Microelectronics Reliability 43(9-11): 1495-1500 (2003) |
| 1 | F. Gámiz | [1] |
| 2 | Andreas Gehring | [1] |
| 3 | Hans Kosina | [1] |
| 4 | A. Palma | [1] |
| 5 | Siegfried Selberherr | [1] |