| |
| 2003 | ||
|---|---|---|
| 1 | EE | T. Ayalew, Andreas Gehring, J. M. Park, Tibor Grasser, Siegfried Selberherr: Improving SiC lateral DMOSFET reliability under high field stress. Microelectronics Reliability 43(9-11): 1889-1894 (2003) |
| 1 | Andreas Gehring | [1] |
| 2 | Tibor Grasser | [1] |
| 3 | J. M. Park | [1] |
| 4 | Siegfried Selberherr | [1] |