![]() | ![]() |
2002 | ||
---|---|---|
2 | EE | F. Saigné, Olivier Quittard, Laurent Dusseau, F. Joffre, C. Oudéa, J. Fesquet, Jean Gasiot: Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. Microelectronics Reliability 42(3): 459-461 (2002) |
2001 | ||
1 | EE | Jim Chung, N. Derhacobian, Jean Gasiot, Michael Nicolaidis, David Towne, R. Velazco: Soft Errors and Tolerance for Soft Errors. VTS 2001: 279-280 |
1 | Jim Chung | [1] |
2 | N. Derhacobian | [1] |
3 | Laurent Dusseau | [2] |
4 | J. Fesquet | [2] |
5 | F. Joffre | [2] |
6 | Michael Nicolaidis | [1] |
7 | C. Oudéa | [2] |
8 | Olivier Quittard | [2] |
9 | F. Saigné | [2] |
10 | David Towne | [1] |
11 | R. Velazco | [1] |