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| 2002 | ||
|---|---|---|
| 2 | EE | F. Saigné, Olivier Quittard, Laurent Dusseau, F. Joffre, C. Oudéa, J. Fesquet, Jean Gasiot: Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. Microelectronics Reliability 42(3): 459-461 (2002) |
| 2001 | ||
| 1 | EE | Jim Chung, N. Derhacobian, Jean Gasiot, Michael Nicolaidis, David Towne, R. Velazco: Soft Errors and Tolerance for Soft Errors. VTS 2001: 279-280 |
| 1 | Jim Chung | [1] |
| 2 | N. Derhacobian | [1] |
| 3 | Laurent Dusseau | [2] |
| 4 | J. Fesquet | [2] |
| 5 | F. Joffre | [2] |
| 6 | Michael Nicolaidis | [1] |
| 7 | C. Oudéa | [2] |
| 8 | Olivier Quittard | [2] |
| 9 | F. Saigné | [2] |
| 10 | David Towne | [1] |
| 11 | R. Velazco | [1] |