| |
| 2002 | ||
|---|---|---|
| 1 | EE | F. Saigné, Olivier Quittard, Laurent Dusseau, F. Joffre, C. Oudéa, J. Fesquet, Jean Gasiot: Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. Microelectronics Reliability 42(3): 459-461 (2002) |
| 1 | Laurent Dusseau | [1] |
| 2 | Jean Gasiot | [1] |
| 3 | F. Joffre | [1] |
| 4 | C. Oudéa | [1] |
| 5 | Olivier Quittard | [1] |
| 6 | F. Saigné | [1] |