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2002 | ||
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1 | EE | F. Saigné, Olivier Quittard, Laurent Dusseau, F. Joffre, C. Oudéa, J. Fesquet, Jean Gasiot: Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. Microelectronics Reliability 42(3): 459-461 (2002) |
1 | J. Fesquet | [1] |
2 | Jean Gasiot | [1] |
3 | F. Joffre | [1] |
4 | C. Oudéa | [1] |
5 | Olivier Quittard | [1] |
6 | F. Saigné | [1] |