| 2004 |
|---|
| 3 | EE | Gregory Freeman,
Jae-Sung Rieh,
Zhijian Yang,
Fernando J. Guarín:
Reliability and performance scaling of very high speed SiGe HBTs.
Microelectronics Reliability 44(3): 397-410 (2004) |
| 2003 |
|---|
| 2 | EE | James S. Dunn,
David C. Ahlgren,
Douglas D. Coolbaugh,
Natalie B. Feilchenfeld,
Gregory Freeman,
David R. Greenberg,
Robert A. Groves,
Fernando J. Guarín,
Youssef Hammad,
Alvin J. Joseph,
Louis D. Lanzerotti,
Stephen A. St. Onge,
Bradley A. Orner,
Jae-Sung Rieh,
Kenneth J. Stein,
Steven H. Voldman,
Ping-Chuan Wang,
Michael J. Zierak,
Seshadri Subbanna,
David L. Harame,
Dean A. Herman Jr.,
Bernard S. Meyerson:
Foundation of rf CMOS and SiGe BiCMOS technologies.
IBM Journal of Research and Development 47(2-3): 101-138 (2003) |
| 1986 |
|---|
| 1 | | Gregory Freeman,
Dick L. Liu,
Bruce A. Wooley,
Edward J. McCluskey:
Two CMOS Metastability Sensors.
ITC 1986: 140-144 |
