| |
| 2004 | ||
|---|---|---|
| 1 | EE | Gregory Freeman, Jae-Sung Rieh, Zhijian Yang, Fernando J. Guarín: Reliability and performance scaling of very high speed SiGe HBTs. Microelectronics Reliability 44(3): 397-410 (2004) |
| 1 | Gregory Freeman | [1] |
| 2 | Fernando J. Guarín | [1] |
| 3 | Jae-Sung Rieh | [1] |