2004 | ||
---|---|---|
2 | EE | Gregory Freeman, Jae-Sung Rieh, Zhijian Yang, Fernando J. Guarín: Reliability and performance scaling of very high speed SiGe HBTs. Microelectronics Reliability 44(3): 397-410 (2004) |
2003 | ||
1 | EE | James S. Dunn, David C. Ahlgren, Douglas D. Coolbaugh, Natalie B. Feilchenfeld, Gregory Freeman, David R. Greenberg, Robert A. Groves, Fernando J. Guarín, Youssef Hammad, Alvin J. Joseph, Louis D. Lanzerotti, Stephen A. St. Onge, Bradley A. Orner, Jae-Sung Rieh, Kenneth J. Stein, Steven H. Voldman, Ping-Chuan Wang, Michael J. Zierak, Seshadri Subbanna, David L. Harame, Dean A. Herman Jr., Bernard S. Meyerson: Foundation of rf CMOS and SiGe BiCMOS technologies. IBM Journal of Research and Development 47(2-3): 101-138 (2003) |
1 | David C. Ahlgren | [1] |
2 | Douglas D. Coolbaugh | [1] |
3 | James S. Dunn | [1] |
4 | Natalie B. Feilchenfeld | [1] |
5 | Gregory Freeman | [1] [2] |
6 | David R. Greenberg | [1] |
7 | Robert A. Groves | [1] |
8 | Youssef Hammad | [1] |
9 | David L. Harame | [1] |
10 | Dean A. Herman Jr. | [1] |
11 | Alvin J. Joseph | [1] |
12 | Louis D. Lanzerotti | [1] |
13 | Bernard S. Meyerson | [1] |
14 | Stephen A. St. Onge | [1] |
15 | Bradley A. Orner | [1] |
16 | Jae-Sung Rieh | [1] [2] |
17 | Kenneth J. Stein | [1] |
18 | Seshadri Subbanna | [1] |
19 | Steven H. Voldman | [1] |
20 | Ping-Chuan Wang | [1] |
21 | Zhijian Yang | [2] |
22 | Michael J. Zierak | [1] |