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L. Fratelli

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2006
2EEC. Abbate, G. Busatto, L. Fratelli, F. Iannuzzo: The high frequency behaviour of high voltage and current IGBT modules. Microelectronics Reliability 46(9-11): 1848-1853 (2006)
2002
1EEG. Busatto, B. Cascone, L. Fratelli, M. Balsamo, F. Iannuzzo, F. Velardi: Non-destructive high temperature characterisation of high-voltage IGBTs. Microelectronics Reliability 42(9-11): 1635-1640 (2002)

Coauthor Index

1C. Abbate [2]
2M. Balsamo [1]
3G. Busatto [1] [2]
4B. Cascone [1]
5F. Iannuzzo [1] [2]
6F. Velardi [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)