| |
| 2002 | ||
|---|---|---|
| 1 | EE | G. Busatto, B. Cascone, L. Fratelli, M. Balsamo, F. Iannuzzo, F. Velardi: Non-destructive high temperature characterisation of high-voltage IGBTs. Microelectronics Reliability 42(9-11): 1635-1640 (2002) |
| 1 | M. Balsamo | [1] |
| 2 | G. Busatto | [1] |
| 3 | L. Fratelli | [1] |
| 4 | F. Iannuzzo | [1] |
| 5 | F. Velardi | [1] |