| |
| 2006 | ||
|---|---|---|
| 2 | EE | F. Iannuzzo, G. Busatto, C. Abbate: Investigation of MOSFET failure in soft-switching conditions. Microelectronics Reliability 46(9-11): 1790-1794 (2006) |
| 1 | EE | C. Abbate, G. Busatto, L. Fratelli, F. Iannuzzo: The high frequency behaviour of high voltage and current IGBT modules. Microelectronics Reliability 46(9-11): 1848-1853 (2006) |
| 1 | G. Busatto | [1] [2] |
| 2 | L. Fratelli | [1] |
| 3 | F. Iannuzzo | [1] [2] |