| |
| 2002 | ||
|---|---|---|
| 1 | EE | T. Cibáková, María Fischerová, Elena Gramatová, Wieslaw Kuzmicz, Witold A. Pleskacz, Jaan Raik, Raimund Ubar: Hierarchical test generation for combinational circuits with real defects coverage. Microelectronics Reliability 42(7): 1141-1149 (2002) |
| 1 | T. Cibáková | [1] |
| 2 | Elena Gramatová | [1] |
| 3 | Wieslaw Kuzmicz | [1] |
| 4 | Witold A. Pleskacz | [1] |
| 5 | Jaan Raik | [1] |
| 6 | Raimund Ubar | [1] |