| |
| 1998 | ||
|---|---|---|
| 4 | EE | Vinay Dabholkar, Sreejit Chakravarty: Computing Stress Tests for Gate Oxide Shorts. VLSI Design 1998: 378-391 |
| 3 | EE | Vinay Dabholkar, Sreejit Chakravarty, Irith Pomeranz, Sudhakar M. Reddy: Techniques for minimizing power dissipation in scan and combinational circuits during test application. IEEE Trans. on CAD of Integrated Circuits and Systems 17(12): 1325-1333 (1998) |
| 1997 | ||
| 2 | EE | Vinay Dabholkar, Sreejit Chakravarty: Computing stress tests for interconnect defects. Asian Test Symposium 1997: 143-148 |
| 1995 | ||
| 1 | EE | Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel: Cyclic stress tests for full scan circuits. VTS 1995: 89-94 |
| 1 | Sreejit Chakravarty | [1] [2] [3] [4] |
| 2 | J. Najm | [1] |
| 3 | Janak H. Patel | [1] |
| 4 | Irith Pomeranz | [3] |
| 5 | Sudhakar M. Reddy | [3] |