J. Najm
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1995
1
EE
Vinay Dabholkar
,
Sreejit Chakravarty
, J. Najm,
Janak H. Patel
: Cyclic stress tests for full scan circuits.
VTS 1995
: 89-94
Coauthor
Index
1
Sreejit Chakravarty
[
1
]
2
Vinay Dabholkar
[
1
]
3
Janak H. Patel
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
