2006 |
22 | EE | Jacques Henri Collet,
Piotr Zajac,
Yves Crouzet,
Andrzej Napieralski:
Contribution of Communications to Dependability in Massively-Defective General-Purpose Nanoarchitectures.
IOLTS 2006: 219-228 |
2005 |
21 | EE | Yves Crouzet,
Jacques Collet,
Jean Arlat:
Mitigating Soft Errors to Prevent a Hard Threat to Dependable Computing.
IOLTS 2005: 295-298 |
20 | EE | Karama Kanoun,
Yves Crouzet,
Ali Kalakech,
Ana-Elena Rugina,
Philippe Rumeau:
Benchmarking the Dependability of Windows and Linux Using PostMark Workloads.
ISSRE 2005: 11-20 |
2004 |
19 | EE | Ali Kalakech,
Karama Kanoun,
Yves Crouzet,
Jean Arlat:
Benchmarking The Dependability of Windows NT4, 2000 and XP.
DSN 2004: 681-686 |
18 | | Philippe David,
Hélène Waeselynck,
Yves Crouzet:
Open source software in critical systems: Motivation and challenges.
IFIP Congress Topical Sessions 2004: 667-678 |
17 | EE | Ali Kalakech,
Tahar Jarboui,
Jean Arlat,
Yves Crouzet,
Karama Kanoun:
Benchmarking Operating System Dependability: Windows 2000 as a Case Study.
PRDC 2004: 261-270 |
2003 |
16 | EE | Jean Arlat,
Yves Crouzet,
Johan Karlsson,
Peter Folkesson,
Emmerich Fuchs,
Günther H. Leber:
Comparison of Physical and Software-Implemented Fault Injection Techniques.
IEEE Trans. Computers 52(9): 1115-1133 (2003) |
2002 |
15 | EE | Tahar Jarboui,
Jean Arlat,
Yves Crouzet,
Karama Kanoun:
Experimental Analysis of the Errors Induced into Linux by Three Fault Injection Techniques.
DSN 2002: 331-336 |
14 | EE | Tahar Jarboui,
Jean Arlat,
Yves Crouzet,
Karama Kanoun,
Thomas Marteau:
Analysis of the Effects of Real and Injected Software Faults: .
PRDC 2002: 51-58 |
2001 |
13 | EE | Alberto Arazo,
Yves Crouzet:
Formal Guides for Experimentally Verifying Complex Software-Implemented Fault Tolerance Mechanisms.
ICECCS 2001: 69-79 |
2000 |
12 | EE | Cláudia Almeida,
Alberto Arazo,
Yves Crouzet,
Karama Kanoun:
Dependability of Computer Control Systems in Power Plants.
SAFECOMP 2000: 165-175 |
1999 |
11 | EE | Jin Mo,
Yves Crouzet:
A Method for Operator Error Detection Based on Plan Recognition.
SAFECOMP 1999: 125-138 |
1998 |
10 | | Jérome Boué,
Philippe Pétillon,
Yves Crouzet:
MEFISTO-L: A VHDL-Based Fault Injection Tool for the Experimental Assessment of Fault Tolerance.
FTCS 1998: 168-173 |
1995 |
9 | | David Powell,
Eliane Martins,
Jean Arlat,
Yves Crouzet:
Estimators for Fault Tolerance Coverage Evaluation.
IEEE Trans. Computers 44(2): 261-274 (1995) |
1994 |
8 | | Pascale Thévenod-Fosse,
Christine Mazuet,
Yves Crouzet:
On Statistical Structural Testing of Synchronous Data Flow Programs.
EDCC 1994: 250-267 |
1993 |
7 | | David Powell,
Eliane Martins,
Jean Arlat,
Yves Crouzet:
Estimators for Fault Tolerance Coverage Evaluation.
FTCS 1993: 228-237 |
6 | | Jean Arlat,
Alain Costes,
Yves Crouzet,
Jean-Claude Laprie,
David Powell:
Fault Injection and Dependability Evaluation of Fault-Tolerant Systems.
IEEE Trans. Computers 42(8): 913-923 (1993) |
1992 |
5 | | Dimiter R. Avresky,
Jean Arlat,
Jean-Claude Laprie,
Yves Crouzet:
Fault Injection for the Formal Testing of Fault Tolerance.
FTCS 1992: 345-354 |
1991 |
4 | | Pascale Thévenod-Fosse,
Hélène Waeselynck,
Yves Crouzet:
An Experimental Study on Software Structural Testing: Deterministic versus Random Input Generation.
FTCS 1991: 410-417 |
1990 |
3 | EE | Jean Arlat,
Martine Aguera,
Louis Amat,
Yves Crouzet,
Jean-Charles Fabre,
Jean-Claude Laprie,
Eliane Martins,
David Powell:
Fault Injection for Dependability Validation: A Methodology and Some Applications.
IEEE Trans. Software Eng. 16(2): 166-182 (1990) |
1980 |
2 | | J. Galiay,
Yves Crouzet,
M. Vergniault:
Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability.
IEEE Trans. Computers 29(6): 527-531 (1980) |
1 | | Yves Crouzet,
Christian Landrault:
Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor.
IEEE Trans. Computers 29(6): 532-537 (1980) |