M. Vergniault
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1980
1
J. Galiay
,
Yves Crouzet
, M. Vergniault: Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability.
IEEE Trans. Computers 29
(6): 527-531 (1980)
Coauthor
Index
1
Yves Crouzet
[
1
]
2
J. Galiay
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
