| |
| 2001 | ||
|---|---|---|
| 1 | EE | G. Golan, E. Rabinovich, A. Inberg, A. Axelevitch, G. Lubarsky, P. G. Rancoita, M. Demarchi, A. Seidman, N. Croitoru: Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors. Microelectronics Reliability 41(1): 67-72 (2001) |
| 1 | A. Axelevitch | [1] |
| 2 | N. Croitoru | [1] |
| 3 | M. Demarchi | [1] |
| 4 | G. Golan | [1] |
| 5 | G. Lubarsky | [1] |
| 6 | E. Rabinovich | [1] |
| 7 | P. G. Rancoita | [1] |
| 8 | A. Seidman | [1] |