| |
| 2008 | ||
|---|---|---|
| 3 | EE | Munkang Choi, Linda S. Milor: Diagnosis of Optical Lithography Faults With Product Test Sets. IEEE Trans. on CAD of Integrated Circuits and Systems 27(9): 1657-1669 (2008) |
| 2006 | ||
| 2 | EE | Munkang Choi, Linda S. Milor: Impact on circuit performance of deterministic within-die variation in nanoscale semiconductor manufacturing. IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1350-1367 (2006) |
| 2005 | ||
| 1 | EE | Changsoo Hong, Linda S. Milor, Munkang Choi, Tom Lin: Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models. Microelectronics Reliability 45(9-11): 1305-1310 (2005) |
| 1 | Changsoo Hong | [1] |
| 2 | Tom Lin | [1] |
| 3 | Linda S. Milor (Linda Milor) | [1] [2] [3] |