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Tom Lin

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2005
1EEChangsoo Hong, Linda S. Milor, Munkang Choi, Tom Lin: Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models. Microelectronics Reliability 45(9-11): 1305-1310 (2005)

Coauthor Index

1Munkang Choi [1]
2Changsoo Hong [1]
3Linda S. Milor (Linda Milor) [1]

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