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| 2005 | ||
|---|---|---|
| 1 | EE | Changsoo Hong, Linda S. Milor, Munkang Choi, Tom Lin: Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models. Microelectronics Reliability 45(9-11): 1305-1310 (2005) |
| 1 | Munkang Choi | [1] |
| 2 | Changsoo Hong | [1] |
| 3 | Linda S. Milor (Linda Milor) | [1] |