Jau-Wen Chen

2005
3	EE	Yoon Huh, Peter Bendix, Kyungjin Min, Jau-Wen Chen, Ravindra Narayan, Larry D. Johnson, Steven H. Voldman: ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. IWSOC 2005: 47-53
2001
2	EE	Q. Li, Yoonjong Huh, Jau-Wen Chen, Peter Bendix, Sung-Mo Kang: ESD design rule checker. ISCAS (5) 2001: 499-502
1	EE	Q. Li, Yoonjong Huh, Jau-Wen Chen, Peter Bendix, Sung-Mo Kang: Full chip ESD design rule checking. ISCAS (5) 2001: 503-506

Coauthor Index

1	Peter Bendix	[1] [2] [3]
2	Yoon Huh	[3]
3	Yoonjong Huh	[1] [2]
4	Larry D. Johnson	[3]
5	Sung-Mo Kang	[1] [2]
6	Q. Li	[1] [2]
7	Kyungjin Min	[3]
8	Ravindra Narayan	[3]
9	Steven H. Voldman	[3]