| |
| 2005 | ||
|---|---|---|
| 1 | EE | Yoon Huh, Peter Bendix, Kyungjin Min, Jau-Wen Chen, Ravindra Narayan, Larry D. Johnson, Steven H. Voldman: ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. IWSOC 2005: 47-53 |
| 1 | Peter Bendix | [1] |
| 2 | Jau-Wen Chen | [1] |
| 3 | Yoon Huh | [1] |
| 4 | Larry D. Johnson | [1] |
| 5 | Kyungjin Min | [1] |
| 6 | Steven H. Voldman | [1] |