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C. K. Chang

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2005
2EEC. F. Tsang, C. K. Chang, A. Krishnamoorthy, K. Y. Ee, Y. J. Su, H. Y. Li, W. H. Li, L. Y. Wong: A study of post-etch wet clean on electrical and reliability performance of Cu/low k interconnections. Microelectronics Reliability 45(3-4): 517-525 (2005)
1988
1EEC. K. Chang, John W. Brackett, A. M. Davis, P. C. Grabon, T. Haizuka, P. Hsia: Specification languages-assessment and trends. ICCL 1988: 160-165

Coauthor Index

1John W. Brackett [1]
2A. M. Davis [1]
3K. Y. Ee [2]
4P. C. Grabon [1]
5T. Haizuka [1]
6P. Hsia [1]
7A. Krishnamoorthy [2]
8H. Y. Li [2]
9W. H. Li [2]
10Y. J. Su [2]
11C. F. Tsang [2]
12L. Y. Wong [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)