2005 | ||
---|---|---|
2 | EE | C. F. Tsang, C. K. Chang, A. Krishnamoorthy, K. Y. Ee, Y. J. Su, H. Y. Li, W. H. Li, L. Y. Wong: A study of post-etch wet clean on electrical and reliability performance of Cu/low k interconnections. Microelectronics Reliability 45(3-4): 517-525 (2005) |
1988 | ||
1 | EE | C. K. Chang, John W. Brackett, A. M. Davis, P. C. Grabon, T. Haizuka, P. Hsia: Specification languages-assessment and trends. ICCL 1988: 160-165 |
1 | John W. Brackett | [1] |
2 | A. M. Davis | [1] |
3 | K. Y. Ee | [2] |
4 | P. C. Grabon | [1] |
5 | T. Haizuka | [1] |
6 | P. Hsia | [1] |
7 | A. Krishnamoorthy | [2] |
8 | H. Y. Li | [2] |
9 | W. H. Li | [2] |
10 | Y. J. Su | [2] |
11 | C. F. Tsang | [2] |
12 | L. Y. Wong | [2] |