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I. Camps

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2005
2EEI. Camps, A. Vercik, Y. Galvão Gobato, M. J. S. P. Brasil, G. E. Marques, S. S. Makler: Negative charged excitons in double barrier diodes. Microelectronics Journal 36(11): 1038-1040 (2005)
1EEY. Galvão Gobato, M. J. S. P. Brasil, I. Camps, H. B. de Carvalho, L. F. dos Santos, G. E. Marques, M. Henini, L. Eaves, G. Hill: Charge buildup effects in asymmetric p-type resonant tunneling diodes. Microelectronics Journal 36(3-6): 356-358 (2005)

Coauthor Index

1M. J. S. P. Brasil [1] [2]
2H. B. de Carvalho [1]
3L. Eaves [1]
4Y. Galvão Gobato [1] [2]
5M. Henini [1]
6G. Hill [1]
7S. S. Makler [2]
8G. E. Marques [1] [2]
9L. F. dos Santos [1]
10A. Vercik [2]

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