D. Bru

2003
2	EE	D. Faure, D. Bru, C. Ali, C. Giret, K. Christensen: Gate oxide breakdown characterization on 0.13mum CMOS technology. Microelectronics Reliability 43(9-11): 1519-1523 (2003)
2002
1	EE	C. Giret, D. Bru, D. Faure, C. Ali, M. Razani, D. Gobled: Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis. Microelectronics Reliability 42(9-11): 1723-1727 (2002)

Coauthor Index

1	C. Ali	[1] [2]
2	K. Christensen	[2]
3	D. Faure	[1] [2]
4	C. Giret	[1] [2]
5	D. Gobled	[1]
6	M. Razani	[1]