| |
| 2002 | ||
|---|---|---|
| 1 | EE | C. Giret, D. Bru, D. Faure, C. Ali, M. Razani, D. Gobled: Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis. Microelectronics Reliability 42(9-11): 1723-1727 (2002) |
| 1 | C. Ali | [1] |
| 2 | D. Bru | [1] |
| 3 | D. Faure | [1] |
| 4 | C. Giret | [1] |
| 5 | M. Razani | [1] |