K. Christensen

2003
2	EE	D. Faure, D. Bru, C. Ali, C. Giret, K. Christensen: Gate oxide breakdown characterization on 0.13mum CMOS technology. Microelectronics Reliability 43(9-11): 1519-1523 (2003)
1998
1		Christian Hicks, S. A. Hines, D. Harvey, F. J. McLeay, K. Christensen: An Agent Based Model of Supply Chains. ESM 1998: 609-613

Coauthor Index

1	C. Ali	[2]
2	D. Bru	[2]
3	D. Faure	[2]
4	C. Giret	[2]
5	D. Harvey	[1]
6	Christian Hicks	[1]
7	S. A. Hines	[1]
8	F. J. McLeay	[1]

Colors in the list of coauthors