Markus Hauser
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2006
1
EE
Heinrich Wolf
,
Horst A. Gieser
,
Detlef Bonfert
, Markus Hauser: ESD Susceptibility of Submicron Air Gaps.
Microelectronics Reliability 46
(9-11): 1587-1590 (2006)
Coauthor
Index
1
Detlef Bonfert
[
1
]
2
Horst A. Gieser
[
1
]
3
Heinrich Wolf
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
