Gosta Pada Biswas

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2000

4 EE Biplab K. Sikdar, Kolin Paul, Gosta Pada Biswas, Parimal Pal Chaudhuri, Vamsi Boppana, Cliff Yang, Sobhan Mukherjee: Theory and Application of GF(2p) Cellular Automata as On-chip Test Pattern Generator. VLSI Design 2000: 556-561

1997

3 EE Gosta Pada Biswas, Idranil Sen Gupta: Design of t-UED/AUED Codes from Berger's AUED Code. VLSI Design 1997: 364-369

2 EE Gosta Pada Biswas, Indranil Sengupta: A Design Technique of TSC Checker for Borden's Code. VLSI Design 1997: 529-530

1995

1 EE Gosta Pada Biswas, Idranil Sen Gupta: Generalized modular design of testable m-out-of-n code checker. Asian Test Symposium 1995: 322-326

2000
4	EE	Biplab K. Sikdar, Kolin Paul, Gosta Pada Biswas, Parimal Pal Chaudhuri, Vamsi Boppana, Cliff Yang, Sobhan Mukherjee: Theory and Application of GF(2p) Cellular Automata as On-chip Test Pattern Generator. VLSI Design 2000: 556-561
1997
3	EE	Gosta Pada Biswas, Idranil Sen Gupta: Design of t-UED/AUED Codes from Berger's AUED Code. VLSI Design 1997: 364-369
2	EE	Gosta Pada Biswas, Indranil Sengupta: A Design Technique of TSC Checker for Borden's Code. VLSI Design 1997: 529-530
1995
1	EE	Gosta Pada Biswas, Idranil Sen Gupta: Generalized modular design of testable m-out-of-n code checker. Asian Test Symposium 1995: 322-326

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