J. A. Bielen

2006
2	EE	P. J. van der Wel, S. J. C. H. Theeuwen, J. A. Bielen, Y. Li, R. A. van den Heuvel, J. G. Gommans, F. van Rijs, P. Bron, H. J. F. Peuscher: Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications. Microelectronics Reliability 46(8): 1279-1284 (2006)
2004
1	EE	Z. Radivojevic, K. Andersson, J. A. Bielen, P. J. van der Wel, J. Rantala: Operating limits for RF power amplifiers at high junction temperatures. Microelectronics Reliability 44(6): 963-972 (2004)

Coauthor Index

1	K. Andersson	[1]
2	P. Bron	[2]
3	J. G. Gommans	[2]
4	R. A. van den Heuvel	[2]
5	Y. Li	[2]
6	H. J. F. Peuscher	[2]
7	Z. Radivojevic	[1]
8	J. Rantala	[1]
9	F. van Rijs	[2]
10	S. J. C. H. Theeuwen	[2]
11	P. J. van der Wel	[1] [2]