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2006 | ||
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2 | EE | Z. Radivojevic, I. Kassamakov, M. Oinonen, H. Saarikko, H. Seppanen, P. Vihinen: Transient IR imaging of light and flexible microelectronic devices. Microelectronics Reliability 46(1): 116-123 (2006) |
2004 | ||
1 | EE | Z. Radivojevic, K. Andersson, J. A. Bielen, P. J. van der Wel, J. Rantala: Operating limits for RF power amplifiers at high junction temperatures. Microelectronics Reliability 44(6): 963-972 (2004) |
1 | K. Andersson | [1] |
2 | J. A. Bielen | [1] |
3 | I. Kassamakov | [2] |
4 | M. Oinonen | [2] |
5 | J. Rantala | [1] |
6 | H. Saarikko | [2] |
7 | H. Seppanen | [2] |
8 | P. Vihinen | [2] |
9 | P. J. van der Wel | [1] |